Guide to Thin Section Microscopy by Michael M. Raith, Peter Raase & Jürgen Reinhardt

By Michael M. Raith, Peter Raase & Jürgen Reinhardt

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Chloritoid; H. Biotite; I. Ti-rich biotite; J. Lazulite; K. Aegirine augite; L. Fe3+-rich epidote (pistacite).

2-5). 2-5: Optically biaxial crystals, crystal symmetry and indicatrix. The indicatrix of crystals with orthorhombic, monoclinic and triclinic symmetry is respresented in a coordinate system with axes X, Y, Z that are orthogonal to each other. The geometry of the triaxial ellipsoid is defined by the proportional lengths of the refractive indices nx, ny, nz on X, Y and Z. Thus, the symmetry of the ellipsoid is generally orthorhombic. The refractive indices are defined as nz > ny > nx (or nγ > nβ > nα).

Inexperienced users should repeat this procedure a couple of times and maybe make notes about, and cross-check, the positions of the various boundary surfaces using the scale at the focusing knobs. For a precise determination of thickness using the upper and lower boundary surfaces of the thin section, it is necessary to turn the focal adjustment in one direction only, eliminating the mechanical backlash. If the thickness from the lower to the upper surface is measured, the starting position of the focal plane must be in the 1 mm thick glass slide.

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