By K. H. Rieder (auth.), Professor Dr. Fabrizio Nizzoli, Dr. Karl-Heinz Rieder, Dr. Roy F. Willis (eds.)
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Additional resources for Dynamical Phenomena at Surfaces, Interfaces and Superlattices: Proceedings of an International Summer School at the Ettore Majorana Centre, Erice, Italy, July 1–13, 1984
It is convenient to describe this limiting size not on the screen, rather on the crystal surface,by the Fourier transform to the transfer function (fig. 9), yielding the transfer width. The transfer width may be calculated with the spot diameter d, the distance L from screen to crystal, the angle ex of the diffracted beam to the crysta 1 norma 1 and the wave 1 ength A to t = A *L/(d*sin ex ), if the profile is measured in the plane of incidence. In the direction normal to that plane ex has to be taken as Zero.
N T(K) (11,12). herently. f the two. n). herence width) due to. n). rtant to. n) to. detect large defect distances (due to. a large transfer width). n. file due to. nse. ssible. t size in the 26 recording of a profile may be caused by finite electron source, imperfect lenses for imaging and finite size detector. It is convenient to describe this limiting size not on the screen, rather on the crystal surface,by the Fourier transform to the transfer function (fig. 9), yielding the transfer width.
J. Chen,T. Sci. o. Hahn, M. Phys. T. O. Hahn, S. Yokohama, M. Sci. (1984) in press M. Henzler, P. T. G. -C. M. Lu in"Ordering in two dimensions" ed. K. Sinha (North Holland, New York 1980) p 113 andin"Chemistry and Physics of Solid Surfaces" ed. R. Vanselow (CRC Press, Boca Raton, Florida 1979), Vol. 2, p. -C. M. Lett. H. T. G. Lett. M. Fiz. Phys. M. -Cahn, Acta Metall. 27, 1085 (1979) H. Froitzheim, in "Electron Spectroscopy for Surface Analysis" ed. H. CurrentPhysics 4, (Springer Berlin 1977) - Metal-Metal Superlattices Charles M.