Data mining and diagnosing IC fails by Leendert M. Huisman

By Leendert M. Huisman

There are many innovations for examining IC fails, yet they're scattered over the pro IC attempt and analysis literature, and in a variety of records and knowledge mining handbooks. in addition, many facts mining recommendations which are general in different info research environments, and which are applicable for reading IC fails, haven't but been hired for that objective.

Data Mining and Diagnosing IC Fails addresses the matter of acquiring greatest details from (functional) built-in circuit fail info in regards to the defects that prompted the fails. It begins on the optimum point from mere type codes, and drills down through a variety of info mining recommendations to specified good judgment prognosis. a number of the techniques mentioned during this publication have an intensive theoretical underpinning, yet are geared in the direction of purposes on actual lifestyles fail information and cutting-edge ICs. This publication brings jointly plenty of research innovations which are compatible for IC fail information, yet that aren't to be had somewhere else in one position. numerous of the strategies, in reality, were offered only in the near past in technical meetings.

The goal of the publication is to collect in a single position a great number of research, information mining and prognosis thoughts that experience confirmed to be valuable in studying IC fails. The descriptions of the innovations and research workouts is adequately distinctive that pro production engineers can enforce them of their personal paintings environment.

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In fact, the technique to control the oscillation amplitude is accomplished since R a changes automatically to produce the neccesary critical gain to force oscillations8. As far as the steadystate operation is along a straight line (see Fig. 13), there is no significant distortion in the output. -Oscillator with non-linear amplifier gain (see [100] for details): A second non-linear method would be to employ an amplifier with a settled but nonlinear gain characteristic instead of the linear gain K considered above (see Fig.

Chapter 1: Oscillation-Based Test Methodology 25 If the existing bibliography is reviewed, two methods can be first reported to obtain robust oscillations. These are either oscillators with non-linear amplifier gain or oscillators with automatic gain control [100]. In both cases, the stabilization of the oscillation signal is not attained in the saturation range of the amplifier because other factors determine this phenomenon. As mentioned before, by introducing an extra nonlinear mechanism, we have two parameters to play with.

Whereas, if K > K c , the poles are in the right half-plane, and thus oscillations grow exponentially in amplitude Chapter 1: Oscillation-Based Test Methodology 21 until going beyond the linear dynamic range of the amplifier (observe Fig. 9). An illustrative case is when the R‘s and C‘s are identical. 19) where ΔK is the deviation of the gain K from the critical value, that for this case is K c = 3 . Due to term ΔK , the pole placement is not exactly at 1 ± jω 0 , but approximately at --- ΔKω 0 ± jω 0 .

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